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pulse Semiconductor Engineering September 10, 2026

Accelerating Shift Left With Early RTL DFT Analysis And Connectivity Verification

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How to address the critical challenge RTL designers face: identifying testability issues late in the design cycle, leading to costly re-spins and schedule delays. This white paper demonstrates how early RTL testability analysis and Design-for-Test (DFT) optimization enable shift left strategies that improve manufacturing test quality, reduce turnaround time, and deliver early quality estimates—all essential for managing growing design complexity and shrinking development cycles. What You’ll Lear

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