Silent Data Errors Redefine Test Coverage And Fleet Maintenance Strategies

Key Takeaways : A chip can pass ATPG, transition-fault, stuck-at, and at-speed structural testing and still produce an incorrect arithmetic result that propagates until a wrong output surfaces. Targeted functional tests at the system level and in the field can catch more of these stealth defects. Broad and deep functional test content and stress tests can identify SDEs in commercial processors. At the fleet level, in-field hardware testing and application testing reduce the operational impact of