AI-Driven Data Feed Forward: Scaling Advanced Test Methodologies For Chiplet-Based Packages

The transition from monolithic dies to chiplet-based architectures in advanced semiconductor packaging leads to a fundamental shift in test complexity. This presentation introduces Data Feed Forward (DFF) infrastructure, designed to collect, transform, transport, and apply test data across the full supply chain, enabling a new generation of data and AI driven test methodologies at scale. At its core, DFF enables test data generated at early production steps to be made available at later test ope