Graph Transformer Speeds IC Interconnect Signal Integrity Analysis (Buffalo, Stuttgart, IBM)

Researchers at the University at Buffalo, University of Stuttgart, and IBM Research published “SI-GT: Fast Interconnect Signal Integrity Analysis For Integrated Circuit Design Via Graph Transformers.” Abstract Excerpt: “In this paper, we propose Si-GT, a novel transformer-based model for fast and accurate signal integrity analysis in IC interconnects.” Find the technical paper here . April 2026. Hu, Yuting, Tarek Mohamed, Chenhui Xu, Hua Xiang, Hussam Amrouch, Gi-Joon Nam, and Jinjun Xiong. “Si-