Innovation First, AI Second: Lessons From SSN And The Future Of Test

By Marc Hutner and Ron Press Artificial Intelligence is rapidly becoming pervasive in society and across semiconductor development processes. We have to be careful not to apply AI to solve optimizations and challenges of existing methods but pair with engineering innovation for evolutionary results. One example is the application of scan test data in multi-core designs. AI can optimize the device IO bandwidth allocation to each core based on the core pattern size. However, an engineering innovat