From Reactive Replacement To Predictive Planning: Unlocking Probe Card Intelligence With Real-Time Data

Probe cards are among the most critical — and costly — assets in wafer test. Even if production line typically prepares on-demand spares, unexpected failure can cause significant downtime and production loss. One of the most persistent challenges is tip-burn degradation: gradual probe tips wear that ultimately leads to failure. A new technical initiative explores whether DC profiling data can provide early warning — days or even weeks before a probe card fails — while also advancing a broader vi