CPO Testing Faces A Moving Target Problem

Key Takeaways: The industry is busy developing different connector designs and laser sources, while massive data centers with the first levels of CPO are being built. In the absence of design-for-test, companies have to test each individual waveguide, resonator or photodiode, which is inefficient and does not scale. Optical components are much more sensitive to slight offset than electronic components, making issues like thermal and warpage particularly troublesome. Experts At The Table : The st