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pulse Semiconductor Engineering October 08, 2026

From Process Learning To Production Control: Trends In Advanced Packaging And Implications To Characterization And Test

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The explosive growth of heterogeneous integration, from 2.5D interposers and CoWoS to hybrid bonding and 3D stacking, is redefining what it means to “ramp a process.” Advanced packaging technologies exhibit yield sensitivities and defect mechanisms fundamentally different from front-end logic or standard packaging technology, yet the industry has lacked purpose-built metrology, characterization, and analytics frameworks to address these new challenges at scale. This presentation explains an inte

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