Shift Left Complicates Fab Data Management

Key Takeaways: “Shift left” improves yield by moving detection earlier. Fabs are using real-time equipment sensor data and AI/ML to identify process excursions inside the process module and improve advanced process control. Higher sampling rates, hundreds of sensor parameters, and sub-second analysis are increasing the volume, velocity, and variety of manufacturing data. Data context and connectivity remain important. However, module-level optimization affects both. Semiconductor fabs are levera