From Test Compression To Hierarchical Connectivity: Scaling SoC Test For AI And HPC Devices

Modern AI and HPC devices are challenging traditional test architectures. As scan data volume, core counts, chiplet integration, and test coverage requirements continue to increase, conventional DFT methodologies are becoming difficult to scale. Synopsys TestMAX Unified Compression, based on DFTMAX SEQ, and Streaming Fabric (SF), a programmable high-bandwidth test data delivery network, provide a new approach that enables scalable, hierarchical, and efficient testing for the next generation of A